Accessing <i>d-d</i> Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS-Reference-Cited by-同舟云学术

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Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Bugnet Matthieu¹²³,Hajraoui Khalil El¹⁴,Kerrigan Adam⁵,Lazarov Vlado K⁴⁵,Radtke Guillaume⁶,Ramasse Quentin M¹²⁷,Kepatsoglou Demie¹⁴

Affiliation:

1. SuperSTEM Laboratory, SciTech Daresbury Campus , United Kingdom

2. School of Chemical and Process Engineering, University of Leeds , United Kingdom

3. Centre National de la Recherche Scientifique, Mateis Laboratory, University of Lyon , France

4. School of Physics, Engineering and Technology, University of York , United Kingdom

5. York-JEOL Nanocentre, University of York , United Kingdom

6. Sorbonne Université, Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie , France

7. School of Physics and Astronomy, University of Leeds , United Kingdom

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.753/58639286/ozae044.753.pdf

Reference5 articles.

1. Nonresonant Inelastic X-Ray Scattering Involving Excitonic Excitations: The Examples of NiO and CoO

2. Probing non-dipole allowed excitations in highly correlated materials with nanoscale resolution

3. Ferromagnetic dislocations in antiferromagnetic NiO

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