Investigation of Cell-Gap Defects Using Gap Simulation
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Published:2006-10-01
Issue:10
Volume:E89-C
Page:1390-1394
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ISSN:0916-8524
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Container-title:IEICE Transactions on Electronics
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language:en
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Short-container-title:IEICE Transactions on Electronics
Author:
ICHIKAWA S.,SUEKUNI K.,ISHIMARU M.,NAKATANI H.,UNATE T.,NAKASUGA A.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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