Extended-Range High-Resolution FMCW Reflectometry by Means of Electronically Frequency-Multiplied Sampling Signal Generated from Auxiliary Interferometer-Reference-Cited by-同舟云学术

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Extended-Range High-Resolution FMCW Reflectometry by Means of Electronically Frequency-Multiplied Sampling Signal Generated from Auxiliary Interferometer

Published:2006-06-01 Issue:6 Volume:E89-C Page:823-829
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Transactions on Electronics

Author:

IIYAMA K.

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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