Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT
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Published:2008-10-01
Issue:10
Volume:E91-C
Page:1564-1569
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ISSN:0916-8524
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Container-title:IEICE Transactions on Electronics
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language:en
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Short-container-title:IEICE Transactions on Electronics
Author:
TAKATORI K.,ASADA H.,KANEKO S.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials