Abstract
Abstract. In this paper, a method for the extraction of data for a through-hole vertical interconnect access (via) on a printed circuit board (PCB) is presented. It uses a matrix de-embedding algorithm and two-port theory to extract the elements of an assumed lumped via model. After that the influence of the via on the power-bus impedance and the coupling between the via and the power-bus are described using this model.
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1 articles.
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1. Novel low cost launch for measuring via-to-cavity coupling;2021 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS);2021-12-13