Abstract
Abstract. An existing analytical transmission line model to describe propagation
properties of coplanar waveguides including dispersion and radiation effects
was extended to take into account surface roughness of conductor traces. The
influence of parasitics is successively included in the simulation and
compared to measurements. The device under test (DUT) was fabricated on an
Al2O3 wafer. A metal and ceramic chuck was utilized during
measurements up to 120 GHz. The extended model is then capable of precisely
predicting propagation properties in a wide frequency range and can now be
used for calibration purposes like the development of uncertainty budgets.
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