Physical IC debug – backside approach and nanoscale challenge-Reference-Cited by-同舟云学术

Physical IC debug – backside approach and nanoscale challenge

Published:2008-05-26 Issue: Volume:6 Page:265-272
ISSN:1684-9973
Container-title:Advances in Radio Science
language:en
Short-container-title:Adv. Radio Sci.

Author:

Boit C.,Schlangen R.,Glowacki A.,Kindereit U.,Kiyan T.,Kerst U.,Lundquist T.,Kasapi S.,Suzuki H.

Abstract

Abstract. Physical analysis for IC functionality in submicron technologies requires access through chip backside. Based upon typical global backside preparation with 50–100 µm moderate silicon thickness remaining, a state of the art of the analysis techniques available for this purpose is presented and evaluated for functional analysis and layout pattern resolution potential. A circuit edit technique valid for nano technology ICs, is also presented that is based upon the formation of local trenches using the bottom of Shallow Trench Isolation (STI) as endpoint for Focused Ion Beam (FIB) milling. As a derivative from this process, a locally ultra thin silicon device can be processed, creating a back surface as work bench for breakthrough applications of nanoscale analysis techniques to a fully functional circuit through chip backside. Several applications demonstrate the power and potential of this new approach.

Publisher

Copernicus GmbH

Link

https://ars.copernicus.org/articles/6/265/2008/ars-6-265-2008.pdf

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