Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs

Abstract

Abstract. Many investigations have been published on the transferability of RF immunity test results between system and IC-levels. The RF signal level at DUT (Device under Test) inputs, i.e. either RF voltage amplitude or RF input current, is used as a reference value for the load on the DUT. Existing approaches analyze the DUT response as a function of the RF signal level at a single input pin, e.g. supply voltage. Sufficient accuracy of such an approach could be shown in several cases, but results are not sufficient as a general solution for complex DUT. This paper proposes both theoretical analysis and practical implementation of a DPI setup, where a disturbance, equivalent to system-level BCI setup, can be delivered to multiple DUT input ports.