Algorithm development for finding the minimum level of noise immunity of an onboard electrical complex during control tests-Reference-Cited by-同舟云学术

Algorithm development for finding the minimum level of noise immunity of an onboard electrical complex during control tests

Published:2020 Issue: Volume:221 Page:01005
ISSN:2267-1242
Container-title:E3S Web of Conferences
language:
Short-container-title:E3S Web Conf.

Author:

Kozlovsky Vladimir,Nikolaev Pavel,Podgorny Alexander,Saksonov Alexander,Shamina Luiza

Abstract

An algorithm for finding the minimum level of noise immunity of the onboard electrical complex during control tests is developed in this paper. The expression is obtained for the frequency tuning step of a narrow-band electromagnetic action and an algorithm is developed that compared with the standard to more accurately find the minimum level of noise immunity of ETS.

Publisher

EDP Sciences

Link

https://www.e3s-conferences.org/10.1051/e3sconf/202022101005/pdf

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