Metrological reliability of primary transducers taking into account element stability and accuracy

Abstract

Probabilistic characteristics of reliability of transient states of semiconductor converter when working together with integrated circuits are considered. The probability of effective transition of the integrated circuit, functioning with semiconductor converter, from the state of logical zero to the state of logical one is established and the corresponding probabilistic equations at sufficient signal and pause duration are obtained. During the period of operation of information and measurement devices and systems, failures occur, which can be sudden and gradual. Sudden failures are categorised as random events. The physical nature of sudden failures is due to the concentration of loads causing corresponding internal damage in the form of winding breakage or short circuit, parts breakage and others. Failure of any element and information device, in particular, measuring transducer of physical quantities, can be determined by the action of the following factors: structural imperfections of the initial materials of the product due to the presence of impurities, dislocations and concentration gradients; external influences - thermal mechanical and electrical loads.