Research Progress of the Effects of Trace S Element on the Microstructure of Cast Nickel-base Superalloys-Reference-Cited by-同舟云学术

Research Progress of the Effects of Trace S Element on the Microstructure of Cast Nickel-base Superalloys

Published:2021 Issue: Volume:299 Page:02004
ISSN:2267-1242
Container-title:E3S Web of Conferences
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Short-container-title:E3S Web Conf.

Author:

Liu Chenguang,Xu Huan,Zhang Hui,Liu Peiyuan,Yang Gong,Cui Lili,Wang Haiwen

Abstract

In the process of alloy melting and vacuum pouring, the impurity S element will inevitably be introduced into the nickel-base superalloys, which will cause adverse effects on the microstructure and properties of the cast nickel-base superalloys. In this paper, the research progress of S element in cast nickel-base superalloys is summarized. The effects of S element on the microstructure are described in detail from experimental researches and first-principles. The reasons for the grain boundary embrittlement caused by S atom are discussed, and the authors wish to provide some references for the better development of cast nickel-base superalloys.

Publisher

EDP Sciences

Link

https://www.e3s-conferences.org/10.1051/e3sconf/202129902004/pdf

Reference29 articles.

1. On the Relationship Between Firm Size and Export Intensity

2. Caves R., Multinational Enterprise and Economic Analysis, Cambridge University Press, Cambridge, 1982. (book style)

3. Clerc M., “The Swarm and the Queen: Towards a Deterministic and Adaptive Particle Swarm Optimization,” In Proceedings of the IEEE Congress on Evolutionary Computation (CEC), pp. 1951–1957, 1999. (conference style)

4. Crokell H.H., “Specialization and International Competitiveness,” in Managing the Multinational Subsidiary, Etemad H. and Sulude L.S. (eds.), Croom-Helm, London, 1986. (book chapter style)

5. Deb K., Agrawal S., Pratab A., Meyarivan T., “A Fast Elitist Non-dominated Sorting Genetic Algorithms for Multiobjective Optimization: NSGA II,” KanGAL report 200001, Indian Institute of Technology, Kanpur, India, 2000. (technical report style)