ANALYSE D'ÉCHANTILLONS STRATIFIÉS À LA MICROSONDE ÉLECTRONIQUE-Reference-Cited by-同舟云学术

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ANALYSE D'ÉCHANTILLONS STRATIFIÉS À LA MICROSONDE ÉLECTRONIQUE

Published:1984-02 Issue:C2 Volume:45 Page:C2-47-C2-50
ISSN:0449-1947
Container-title:Le Journal de Physique Colloques
language:
Short-container-title:J. Phys. Colloques

Author:

Pouchou J. L.,Pichoir F.

Publisher

EDP Sciences

Subject

General Engineering

Link

http://jphyscol.journaldephysique.org/10.1051/jphyscol:1984212/pdf

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Polyphase post-Variscan thinning of the North Pyrenean crust: Constraints from the P-T-t-deformation history of the exhumed Variscan lower crust (Saleix Massif, France);Tectonophysics;2021-12

2. Aluminum-enhanced alkali diffusion from float glass to PVD-sputtered silica thin films;Journal of the American Ceramic Society;2017-11-22

3. Measuring surface and grain boundary segregation using wavelength dispersive X-ray spectroscopy;Surface Science;2008-07

4. TRANSFORMATION SEQUENCES OF COPPER SULFIDES AT VIELSALM, STAVELOT MASSIF, BELGIUM;The Canadian Mineralogist;2005-04-01

5. Multiple voltage electron probe microanalysis of fission gas bubbles in irradiated nuclear fuel;Journal of Nuclear Materials;2000-12

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