INTEGRAL/IBIS polarization detection in the hard and soft intermediate states of Swift J1727.8−1613

Author:

Bouchet T.ORCID,Rodriguez J.ORCID,Cangemi F.,Thalhammer P.ORCID,Laurent P.ORCID,Grinberg V.ORCID,Wilms J.ORCID,Pottschmidt K.ORCID

Abstract

Aims. Soft γ-ray emission (100 keV–10 MeV) has previously been detected in the hard state of several microquasars. In some sources, this emission was found to be highly polarized and was suggested to be emitted at the base of the jet. Until now, no γ-ray polarization had been found in any other state. Methods. Using INTEGRAL/IBIS, we studied the soft γ-ray spectral and polarization properties of Swift J1727.8−1613 throughout its outburst. Results. We detect a highly polarized spectral component in both the hard intermediate state and the early stages of the soft intermediate state above 210 keV. In the hard intermediate state, the polarization angle significantly deviates from the compact jet angle projected onto the sky, whereas in the soft intermediate they are closely aligned. This constitutes the first detection of jet-aligned polarization in the soft γ-ray for a microquasar. We attribute this polarized spectral component to synchrotron emission from the jet, which indicates that some of the jet might persist into the softer states.

Publisher

EDP Sciences

Reference40 articles.

1. Arnaud K. A. 1996, in Astronomical Data Analysis Software and Systems V, eds. Jacoby G. H., & Barnes J., ASP Conf. Ser., 101, 17

2. Belloni T. 2010, States and Transitions in Black Hole Binaries (Berlin: Springer), 53

3. Frequency-dependent polarization in blazars

4. Spectral polarization properties of optically thin synchrotron radiation

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3