MONOX: a characterization tool for the X-UV range-Reference-Cited by-同舟云学术

MONOX: a characterization tool for the X-UV range

Published:2005-08 Issue:2 Volume:31 Page:147-152
ISSN:1286-0042
Container-title:The European Physical Journal Applied Physics
language:
Short-container-title:Eur. Phys. J. Appl. Phys.

Author:

André J.-M.,Avila A.,Barchewitz R.,Benbalagh R.,Delaunay R.,Druart D.,Jonnard P.,Ringuenet H.

Publisher

EDP Sciences

Subject

Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://epjap.epj.org/10.1051/epjap:2005047/pdf

Reference17 articles.

1. D. Attwood,Soft X-rays and Extreme Ultraviolet Radiation, Principles and Applications(Cambridge University Press, Cambridge, 1999)

2. Y. Cauchois, C. Sénemaud,Tables Internationales des Constantes Sélectionnées “Longueurs d'Onde des Émissions X et des Discontinuités d'Absorption”(Pergamon Press, Oxford, 1978)

3. X‐ray monochromator system for use with synchrotron radiation sources

4. Multilayer mirror for x rays below 190 eV

5. Hybridization of Al and O states in alpha- and gamma-alumina

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