The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendellösung fringe analysis in X-ray topography-Reference-Cited by-同舟云学术

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The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendellösung fringe analysis in X-ray topography

Published:2004-07 Issue:1-3 Volume:27 Page:443-446
ISSN:1286-0042
Container-title:The European Physical Journal Applied Physics
language:
Short-container-title:Eur. Phys. J. Appl. Phys.

Author:

Murphy G.,Whelan P. F.,McNally P. J.,Tuomi T.,Simon R.

Publisher

EDP Sciences

Subject

Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://www.epjap.org/10.1051/epjap:2004087/pdf

Reference17 articles.

1. A. R. Lang,Diffraction and Imaging Techniques in Material Science,edited by S. Amelinckx, R. Gevers, J. Van Landuyt (Amsterdam: North-Holland, 1978), p. 623

2. Use of synchrotron radiation in X-ray diffraction topography

3. A. Authier,Diffraction and Imaging Techniques in Material Science,edited by S. Amelinckx, R. Gevers, J. Van Landuyt (Amsterdam: North-Holland, 1978), p. 715

4. Fourier Filtering of Synchrotron White-Beam Topographs

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