Determination of the evolution of the surface potential of a charging insulator by measuring the intensity of its X-ray characteristic peaks
Author:
Publisher
EDP Sciences
Subject
Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://www.epjap.org/10.1051/epjap:2005068/pdf
Reference15 articles.
1. About the secondary electron yield and the sign of charging of electron irradiated insulators
2. Quantitative measurement of surface potential and amount of charging on insulator surface under electron beam irradiation
3. X. Meyza, D. Goeuriot, C. Guerret-Piécourt, D. Tréheux, H-J. Fitting, J. Appl. Phys.94, 5384 (2003)
4. Secondary electron emission of an insulating target induced by a well-focused electron beam - Monte Carlo simulation study
5. D. Braga, Ph.D. Thesis, University of Paris XI, 2003
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