Analytical description of mirror plot in insulating target
Author:
Publisher
EDP Sciences
Subject
Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://www.epjap.org/10.1051/epjap:2006130/pdf
Reference32 articles.
1. Flashover in wide‐band‐gap high‐purity insulators: Methodology and mechanisms
2. Charge trapping on different cuts of a single‐crystalline α‐SiO2
3. Electron trapping in amorphous SiO2studied by charge buildup under electron bombardment
4. A time‐resolved current method for the investigation of charging ability of insulators under electron beam irradiation
5. Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties
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1. Investigation of trapped charges profile for an irradiated insulated material;Journal of Microscopy;2022-04-13
2. Determination of electrons location using mirror effect phenomena in scanning electron microscope;Journal of Physics: Conference Series;2021-07-01
3. Characterization of trapped charges distribution in terms of mirror plot curve;Ultramicroscopy;2018-01
4. Investigation of scanning electron beam parameters in terms of the disk-charged approximation for the sample potential;Optik;2016-09
5. Computational investigation of electron path inside SEM chamber in mirror effect phenomenon;Micron;2013-08
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