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Spectroscopic study of interfaces in Al/Ni periodic multilayers

  • Published:2009-01-31 Issue:2 Volume:45 Page:20502
  • ISSN:1286-0042
  • Container-title:The European Physical Journal Applied Physics
  • language:
  • Short-container-title:Eur. Phys. J. Appl. Phys.

Author:

Le Guen K.,Gamblin G.,Jonnard P.,Salou M.,Ben Youssef J.,Rioual S.,Rouvellou B.

Publisher

EDP Sciences

Subject

Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers;Rare Metal Materials and Engineering;2014-11

2. Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications;Applied Physics A;2011-12-06

3. Characterization of EUV periodic multilayers;X-Ray Spectrometry;2011-07-26

4. Some techniques to characterize multilayers and their interfaces;Seventh International Conference on Thin Film Physics and Applications;2010-10-11

5. TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film;Microscopy and Microanalysis;2010-10-01
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