A study on the performances of the run sum chart under the gamma process

Author:

Le Goh Kai,Teoh Wei Lin,Chong Zhi Lin,Ong Kai Lin,El-Ghandour Laila

Abstract

The run sum (RS) chart is known as a simple and powerful tool for monitoring the mean of a process. Most developments of the RS chart assume that the underlying process comes from a normal distribution. However, in practice, many processes tend to follow a non-normal distribution. These non-normal processes affect the performances of control charts under the design of normal distribution. In this paper, we present a detailed analysis on the performances of the RS chart when the underlying data come from a gamma distribution. By using Monte Carlo simulation approach, the run-length properties, namely the average run length and the standard deviation of the run length will be computed. Particularly, the 4 and 7 regions RS charts under both distributions are considered. When the charts’ parameters specifically designed for the normal distribution are used to monitor the data from a gamma distribution, simulated results show that RS charts’ performances are significantly deteriorated. The RS chart has higher false alarm rates when the underlying distribution is gamma.

Publisher

EDP Sciences

Reference22 articles.

1. Shewhart W.A., Economic control of quality of manufactured product, New York: Van Nostrand (1931)

2. A Comparison of Some Control Chart Procedures

3. The Run Sum Control Chart Procedure

4. Improving the performance of the zone control chart

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