High resolution selective reflection spectroscopy as a probe of long-range surface interaction : measurement of the surface van der Waals attraction exerted on excited Cs atoms-Reference-Cited by-同舟云学术

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High resolution selective reflection spectroscopy as a probe of long-range surface interaction : measurement of the surface van der Waals attraction exerted on excited Cs atoms

Published:1992-04 Issue:4 Volume:2 Page:631-657
ISSN:1155-4312
Container-title:Journal de Physique II
language:
Short-container-title:J. Phys. II France

Author:

Chevrollier Martine,Fichet Mich�le,Oria Marcos,Rahmat Gabriel,Bloch Daniel,Ducloy Martial

Publisher

EDP Sciences

Subject

Physics and Astronomy (miscellaneous),General Engineering,Atomic and Molecular Physics, and Optics

Link

http://jp2.journaldephysique.org/10.1051/jp2:1992108/pdf

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