Elliptic tangent imaging method for layered plate interfacial defects based on non-dispersive guided waves

Abstract

Layered structures play an increasingly pivotal role in diverse fields such as aerospace, pipeline transportation, and petrochemical engineering. However, defects situated at the interfaces between layers pose a challenge for conventional Non-Destructive testing (NDT) methods, impeding accurate imaging. This research introduces the elliptic tangent imaging method based on interface wave modes to visualize interfacial defects within layered structures. The interface wave mode, characterized by high-frequency non-dispersive traits, facilitates precise localization of defects. Its energy concentration in the interface enhances sensitivity to interfacial defects. The elliptic tangent imaging method proposed in this paper capitalizes on the transmission coefficients of the oblique incidence technique for surface waves, enabling the concurrent determination of defect location and orientation using one pair of transducers. The application of the orthogonal matched pursuit algorithm for sparse representation of the raw signal further enhances positioning accuracy. This paper establishes an automatic detection system for interface waves, demonstrating swift transducer switching. Experimental validation of wave velocity aligns closely with theoretical calculations. In experiments focusing on interfacial defect imaging in bilayer aluminum-steel plates, the system exhibits the capability to accurately depict interfacial defects with varying orientations.