Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods-Reference-Cited by-同舟云学术

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Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods

Published:1991 Issue:5 Volume:2 Page:531-546
ISSN:1154-2799
Container-title:Microscopy Microanalysis Microstructures
language:
Short-container-title:Microsc. Microanal. Microstruct.

Author:

Balossier Gérard,Thomas Xavier,Michel Jean,Wagner Denis,Bonhomme Pierre,Puchelle Edith,Ploton Dominique,Bonhomme Annie,Pinon Jean Michel

Publisher

EDP Sciences

Subject

Instrumentation

Link

http://mmm.edpsciences.org/10.1051/mmm:0199100205053100/pdf

Reference35 articles.

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Accurate EELS background subtraction – an adaptable method in MATLAB;Ultramicroscopy;2020-10

4. From a physicist's toy to an indispensable analytical tool in many fields of science;Ultramicroscopy;2017-09

5. EELS Spectrum‐Imaging for Boron Detection in Biological Cryofixed Tissues;Instrumentation Science & Technology;2005-11

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