Point source physics: Application to electron projection microscopy and holography-Reference-Cited by-同舟云学术

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Point source physics: Application to electron projection microscopy and holography

Published:1994 Issue:4-6 Volume:5 Page:501-508
ISSN:1154-2799
Container-title:Microscopy Microanalysis Microstructures
language:
Short-container-title:Microsc. Microanal. Microstruct.

Author:

Morin Roger

Publisher

EDP Sciences

Subject

Instrumentation

Link

http://mmm.edpsciences.org/10.1051/mmm:0199400504-6050100/pdf

Reference13 articles.

1. A New Microscopic Principle

2. Highly monochromatic electron point‐source beams

3. Theory of a single-atom point source for electrons

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bright sources under the projection microscope: using an insulating crystal on a conductor as electron source;The European Physical Journal Applied Physics;2022

2. Holography and Coherent Diffraction Imaging with Low-(30–250 eV) and High-(80–300 keV) Energy Electrons: History, Principles, and Recent Trends;Materials;2020-07-10

3. A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range imaging;Ultramicroscopy;2019-05

4. Holography in education and popular science: a new versatile and vibrationless color device;European Journal of Physics;2018-11-14

5. High spatial resolution detection of low-energy electrons using an event-counting method, application to point projection microscopy;Review of Scientific Instruments;2018-04

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