Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces-Reference-Cited by-同舟云学术

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Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Published:1991 Issue:6 Volume:2 Page:649-649
ISSN:1154-2799
Container-title:Microscopy Microanalysis Microstructures
language:
Short-container-title:Microsc. Microanal. Microstruct.

Author:

Sarid Dror,Coratger Roland,Ajustron François,Beauvillain Jacques

Publisher

EDP Sciences

Subject

Instrumentation

Link

http://mmm.edpsciences.org/10.1051/mmm:0199100206064900/pdf

Reference2 articles.

1. Atomic Force Microscope

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