From direct ion images to ion probe scanning
Author:
Publisher
EDP Sciences
Subject
Instrumentation
Link
http://mmm.edpsciences.org/10.1051/mmm:0199200302-309900/pdf
Reference18 articles.
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. Isotopic fractionation of silicon negative ions sputtered from minerals by Cs+ bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-03
4. Focussing of a transient low energy Cs+probe for improved NanoSIMS characterizations;The European Physical Journal Applied Physics;2008-04-30
5. Morphological and chemical studies of pathological human and mice brain at the subcellular level: Correlation between light, electron, and nanosims microscopies;Microscopy Research and Technique;2007
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