X-Ray diffraction and Raman spectroscopy for a better understanding of ZnO:Al growth process-Reference-Cited by-同舟云学术

X-Ray diffraction and Raman spectroscopy for a better understanding of ZnO:Al growth process

Published:2011 Issue: Volume:2 Page:25002
ISSN:2105-0716
Container-title:EPJ Photovoltaics
language:
Short-container-title:EPJ Photovolt.

Author:

Charpentier C.,Prod’homme P.,Maurin I.,Chaigneau M.,Roca i Cabarrocas P.

Publisher

EDP Sciences

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

http://www.epj-pv.org/10.1051/epjpv/2011026/pdf

Reference27 articles.

1. Challenges in microcrystalline silicon based solar cell technology

2. Transparent conducting oxide films for thin film silicon photovoltaics

3. TCO and light trapping in silicon thin film solar cells

4. High transmittance and low resistive ZnO:Al films for thin film solar cells

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