Soft X-ray spectroscopy
Author:
Publisher
EDP Sciences
Subject
General Physics and Astronomy,General Engineering
Link
http://jp3.journaldephysique.org/10.1051/jp3:1994228/pdf
Reference23 articles.
1. Romand M., Bador R., Charbonnier M. and Gaillard F., Surface and near-surface chemical characterization by low-energy electron induced X-ray spectrometry (Leeixs) ;X-ray Spectrometry16(1987) 7.
2. Romand M., Gaillard F., Charbonnier M. and Urch D. S., Fundamentals of X-ray spectrometric analysis using low-energy electron excitation ;Adv. X-ray Anal.34(1991) 105.
3. Soft X-ray spectroscopy (20-150 Å) with a conventional X-ray spectrometer
4. Nicolosi J. A., Groven J. P., Merlo D. and Jenkins R.. Layered synthetic micro-structures for long wavelength X-ray spectrometry,Opt. Eng.,25(1986) 964.
5. Crystals for soft X-ray spectroscopy
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3. Electron energy-loss near-edge structure - a tool for the investigation of electronic structure on the nanometre scale;Journal of Microscopy;2001-08
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