Characterization of undoped high resistivity CdTe grown by a THM method

Author:

Stuck R.,Muller J.C.,Siffert P.

Publisher

EDP Sciences

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Heavy metal doping of CdTe crystals;IEEE Transactions on Nuclear Science;2004-12

2. A new method for evaluation of transport properties in CdTe and CZT detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-06

3. Electrical characterization of vacuum-deposited n-CdS/p-CdTe heterojunction devices;Semiconductor Science and Technology;1997-05-01

4. About the origin of the 0.15 to 0.20 eV defect level in cadmium telluride;Physica Status Solidi (a);1987-03-16

5. Experimental investigations and numerical integration of the thermally stimulated current rate equations for defect parameters in CdTe crystals;Journal of Applied Physics;1987-03-15

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