Author:
Alabedra R.,Maille C.,Ratsira D.,Lecoy G.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. APD's excess noise measurements using spectral analysis (FFT);Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1997-03
2. Noise as a diagnostic tool for quality and reliability of electronic devices;IEEE Transactions on Electron Devices;1994
3. Avalanche noise associated with gate current of Si JFET;Electronics Letters;1987