NI Based System for Seu Testing of Memory Chips for Avionics
Author:
Publisher
EDP Sciences
Subject
General Medicine
Link
http://www.matec-conferences.org/10.1051/matecconf/20167901028/pdf
Reference9 articles.
1. Effect of Cosmic Rays on Computer Memories
2. Single-event effects in avionics
3. SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND
4. An evaluation of the sensitivity of integrated circuits to single event effects for the point charge collection area
5. Laser Testing Methodology for Diagnosing Diverse Soft Errors in a Nanoscale SRAM-Based FPGA
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1. Effects of space radiation on resistive memory and comparison with other types of non-volatile memory;2022 Moscow Workshop on Electronic and Networking Technologies (MWENT);2022-06-09
2. Features of the Software Component of the Memory Test SetupBased on the Object-Oriented Approach in LabVIEW Development Environment;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13
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