Author:
Zajačko Ivan,Gál Tomáš,Ságová Zuzana,Mateichyk Vasyl,Wiecek Dariusz
Abstract
The article deals with methods of Artificial Intelligence and their utilisation in technical diagnostics. Special meaning will be given on methods such as Deep learning. The deep learning method seems to be a very good candidate for defect detection and pattern recognition. The method was applied for technical diagnostic in automotive factory and the problem will be described in the paper.
Cited by
15 articles.
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