Organizational Legitimacy, Reputation, and Status: Insights from Micro-Level Measurement
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Published:2020-03
Issue:1
Volume:6
Page:107-136
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ISSN:2168-1007
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Container-title:Academy of Management Discoveries
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language:en
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Short-container-title:AMD
Author:
Bitektine Alex1,
Hill Kevin2,
Song Fei3,
Vandenberghe Christian2
Affiliation:
1. Concordia University
2. HEC Montréal
3. Ryerson University
Publisher
Academy of Management
Cited by
55 articles.
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