SILAR Synthesized ZnO Thin Films

Abstract

Zinc oxide (ZnO) thin films are synthesized by using modified successive ionic layer adsorption and reaction techniques (SILAR) on glass substrate at room temperature. These as deposited thin films are characterized for structural, compositional, surface morphology and optical characterizations using X-ray diffraction (XRD), energy dispersive X-ray absorption spectra analysis (EDAX), atomic force microscopy (AFM) and Uv-vis absorption spectroscopy. From XRD pattern; the low intensity peaks indicate that the films consist coarsely fine grains and/or amorphous in nature. The diffraction peaks observed at 2θ = 31.71 ̊, 36.27 ̊and 56.29 ̊ are attributed to (100), (101) and (110) planes having hexagonal phase while EDAX shows elemental traces for Zn and O. Surface morphology observed from the AFM corresponds granular shape evenly distributed over substrate surface.