Affiliation:
1. Tecnológico Nacional de México
Abstract
In view of the fact that X-ray sources present characteristic spectra that make them unique, the spectral fitting technique has proven to play a fundamental role through the use of models that make it possible to reproduce the observed spectrum, thus making it possible to characterize the type of source that gave rise to it. A tool of paramount importance, among others that are currently gaining ground, is the XSPEC software, which is a solid and stable spectral fitting package that allows us to conduct scientific work with high standards of rigor in the analysis of data from astronomical objects in whose processes high energies are intrinsically involved, as is the case of X-rays. In this work we fit and analyze experimental data of two X-ray binary spectra: Cyg X-1 and V 0332+53, with theoretical models in XSPEC to obtain the expected statistics of the best fit through the reduced chi-square (hereafter, χ2) in both astronomical sources. From the results, it can be concluded that in both sources the best fit representing the physical processes occurring in these binaries was achieved, very close to results obtained by other authors using different techniques, contributing to the state of the art of the spectrum of astrophysical processes of high energy binaries.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Radiation
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