Monitoring of Properties Subjected to Innovative Technological Treatments of Subsurface Layers of Materials by AMD-Methods-Reference-Cited by-同舟云学术

Monitoring of Properties Subjected to Innovative Technological Treatments of Subsurface Layers of Materials by AMD-Methods

Published:2022-02-15 Issue: Volume:910 Page:713-719
ISSN:1662-9795
Container-title:Key Engineering Materials
language:
Short-container-title:KEM

Author:

Derkachev Igor¹,Kustov Alexander¹,Kulakov Mikhail²,Baklanov Oleg³

Affiliation:

1. Voronezh State Pedagogical University

2. BONN Elektronik GmbH, Ohmstr. 11, Holzkirchen, Deutschland

3. Air Force Academy Named Prof.N.E. Zhukovsky and Y.A. Gagarin

Abstract

In this paper, it is proposed to use modern research AMD-methods to monitor the properties of the subsurface layers of materials subjected to innovative technological treatments. They are based on the analysis of the parameters of acoustic waves reflected from the subsurface layers of the studied materials. The technological processing leads to a change in the acoustic characteristics, the value of which is calculated by the values of the parameters of the material of the samples. The effectiveness of the application of methods of acoustic-microscopic flaw detection for the analysis of the state of materials after thermal, chemical, deformation, and diffusion effects is demonstrated.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://www.scientific.net/KEM.910.713.pdf

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