Position Resolved In-Situ X-Ray Observation of Recrystallization and Its Description by Self-Organized Criticality
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Published:2004-10
Issue:
Volume:467-470
Page:689-696
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Affiliation:
1. Deutsches Elektronen-Synchrotron DESY
Abstract
A novel X-ray diffraction method, allowing the position resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference11 articles.
1. Juul Jensen, D., Poulsen, H.F., Recrystallization in 3d, in: N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, J.A. Wert, Proc. 21st Riso Int. Symp. Mat. Sci, Risø National Laboratory, Roskilde pp.103-124, (2000). 2. Wroblewski, T., Geier, S., Hessmer, R., Schreck, M., Rauschenbach, B., X-ray imaging of polycrystalline materials, Rev. Sci. Instrum. Vol. 66, pp.3560-3562 , (1995). 3. Wroblewski, T., Clauß, O., Crostack, H. -A., Ertel, A., Fandrich, F., Genzel, Ch., Hradil, K., Ternes, W., Woldt, E., A new diffractometer for materials science and imaging at HASYLAB beamline G3, Nucl. Instrum. Meth. A Vol. 428, pp.570-582, (1999). 4. Wroblewski, T., and Woldt, E., Non-ambient micro diffraction, Adv. X-ray Anal. Vol. 42-30 CDROM. 5. Humphreys, F.J., Hatherly, M., Recrystallization and Related Annealing Phenomena, Pergamon, Oxford, (1996).
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