Abstract
The ferroelectric properties of UV irradiated and non-irradiated SBT thin films using
photosensitive starting precursors were investigated. The observation of surface microstructure showed that
UV irradiation and increase in anneal temperature induced the grain growth of SBT. The measured remnant
polarization values of UV irradiated and non-irradiated SBT films after anneal at 700oC were 5.8 and 4.7
)C/cm2 and after anneal at 750oC, the values were 10.8 and 9.3 )C/cm2, respectively.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science