Affiliation:
1. Tokyo Institute of Technology
Abstract
A quantitative elucidation of the void formation in a growing scale with Schottky defects
and p-type conduction during high temperature oxidation of metals. The evaluation of the
divergence of ionic fluxes indicates that
(1) Voids form in the scale preferentially in the vicinity of the metal/scale interface,
(2) The volume of voids increases in a parabolic manner,
(3) The volume fraction of voids and the scale is independent of time.
The comparison between the calculation and the experimentally observed scale microstructure of
NiO and CoO confirmed well the validity of the prediction.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
6 articles.
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