Affiliation:
1. Max Planck Institute for Metals Research
2. Max Planck Institute for Intelligent Systems
3. Universität Stuttgart
Abstract
A rigorous strategy for (X-ray) diffraction stress measurements at fixed
penetration/information depths is described. Thereby errors caused by lack of penetration-depth
control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of
accessible penetration/information depths and experimental aspects are briefly discussed. The power
of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited
nickel layer.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
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