Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors-Reference-Cited by-同舟云学术

Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors

Published:2006-05 Issue: Volume:514-516 Page:13-17
ISSN:1662-9752
Container-title:Materials Science Forum
language:
Short-container-title:MSF

Author:

Martins Rodrigo¹,Costa Daniel¹,Águas Hugo¹,Soares Fernanda¹,Marques António¹,Ferreira Isabel¹,Borges P.M.R.²,Pereira Sergio³,Raniero Leandro¹,Fortunato Elvira⁴

Affiliation:

1. Universidade Nova de Lisboa

2. Tekelec

3. Universidade de Aveiro

4. New University of Lisbon

Abstract

This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.scientific.net/MSF.514-516.13.pdf

Reference8 articles.

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