Affiliation:
1. Bright Crystals Technology Inc.
Abstract
The synthetic quartz crystal is widely utilized in electronic and optical components due to its high frequency and temperature stability, good dielectric properties, low thermal coefficient of linear expansion, and wide range of optical transparency. However, radiation effects due to cosmic rays are responsible for a frequency shift for quartz oscillators in space systems, which impair their performance. Sweeping quartz at high electric field is a well-established method for improving device performance in a radiation environment. The present paper focuses on the voltage current characteristic of swept quartz. First, the sweeping conduction mechanism is ionic conduction. Second, as the voltage increases, the current increases first, then decreases, and then increases. ICP-AES results indicated that the sweeping process make Na+ a oriented locomotion. Third, the etch channel tensity is obviously reduced to less than 3/cm3, which is a very promising result for space applications. Moreover, the radiation resistance properties are improved after electrical sweeping.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Reference5 articles.
1. Hezhen Jing, Chenjun Liu. Synthetic Quartz Crystal Technology, Science Press, Beijing, (1992).
2. J. Lefèvre, S. Devautour-Vinot, O. Cambon, J. -J. Boy, P. Guibert, R. Chapoulie, C. Inguimbert, D. Picchedda, A. Largeteau, G. Demazeau, G. Cibiel, Characterization of unswept and swept quartz crystals for space applications. Journal of applied physics, 105 (2009).
3. Herbert G. Lipson, Alfred Kahan, Effects of vacuum sweeping and radiation on defect distribution in quartz. IEEE Transactions on Nuclear Science, NS-31 (1984), 1223-1229.
4. John G. Gualtieri, Sweeping quartz crystals, IEEE Ultrasonics symposium, 1989, 381-390.
5. Harish Bahadur, Sweeping Investigations on as Grown Al-Li+ and Al-OH- Centers in Natural Crystalline Quartz. IEEE Transactions on ultrasonics, ferroelectrics, and frequency control, 42, (1995), 153-158.