The Two Dimensional Microstage Used in Geometric Measurement of Rockwell Diamond Indenter-Reference-Cited by-同舟云学术

The Two Dimensional Microstage Used in Geometric Measurement of Rockwell Diamond Indenter

Published:2015-06 Issue: Volume:649 Page:90-96
ISSN:1662-9795
Container-title:Key Engineering Materials
language:
Short-container-title:KEM

Author:

Pan Sheau Shi¹,Ni I Chih¹,Yang Feng Yu¹

Affiliation:

1. Center for Measurement Standards

Abstract

The Primary Rockwell Hardness Standard System was set up in the Center for Measurement Standards since July 1996 till June 1997. During the period, a compact laser interferometer, HP10737R 3-axis interferometer system was used to measure the effect of pitch and yaw of the Rockwell Hardness standard machine. Considering to increase the performance of hardness measurement, the geometry of the diamond tip has to be determined. In this paper, we will present the results of indenter geometry by μ-CMM (Coordinate Measuring Machine) in CMS.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://www.scientific.net/KEM.649.90.pdf

Reference10 articles.

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