Preparation and High-Frequency Dielectric Properties of Cu/SiO2 Composites

Abstract

In this paper, Cu/SiO2composites with different metal contents were successfully prepared by a selective reduction process. The phase composition and microstructure of composites were analyzed by XRD and SEM, respectively. The results show that spherical copper particles are uniformly distributed in silica matrix. The impedance and permittivity of composites were tested with RF impedance analyzer (0.1~1 GHz). It is indicated Cu/SiO2composites exhibit capacitive character. In addition, the dielectric constants get enlarged due to the enhancement of interface polarization.