Affiliation:
1. Shanghai University
2. National Sun Yat-Sen University
3. Chinese Academy of Science
4. Shanghai Institute of Technology
Abstract
Thallium-doped cesium iodide CsI(Tl) scintillation film has been manufactured by radio frequency (RF) magnetron sputter method onto the quartz glass substrates. The X-ray diffraction (XRD) pattern of the film shows preferable growth of the crystalline film in the (200) orientation. The optical and scintillation properties of CsI(Tl) film were investigated, including photoluminescence excitation (PLE), photoluminescence (PL), X-ray excited luminescence (XEL) spectra and decay curve. The main emission peak at about 2.28 eV is related to the radiative relaxation from the strong-off configuration of localized excitons around Tl+ ions. Under UV excitation, the 2.28 eV emission of CsI(Tl) film presents a single exponential decay with 545 ns.
Publisher
Trans Tech Publications, Ltd.
Reference18 articles.
1. W. Van Sciver and R. Hofstadter: Phys. Review Vol. 84 (1951), p.1062.
2. T. Jing, C. A. Goodman, J. Drewery, G. Cho, W. S. Hong, H. Lee, S. N. Kaplan, A. Mireshghi, V. Perez-Mendez and D. Wildermuth: IEEE Trans. Nucl. Science Vol. 41 (1994), p.903.
3. T. Jing, G. Cho, J. Drewery, I. Fujieda, S. N. Kaplan, A. Mireshghi, V. Perez-Mendez and D. Wildermuth: IEEE Trans. Nucl. Science Vol. 39 (1992), p.1195.
4. S. Liu, W. Zhou, Y. Yang, W. Chen, J. Zhang and P. Zeng: Proc. SPIE Vol. 7658 (2010), p.765838.
5. A. Lebedinsky, A. Fedorov, A. Ananenko and P. Mateychenko. Funct. Materials Vol. 14 (2007), p.42.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献