Two-Photon Selective Reflection Spectroscopy of Confined Atomic Vapor at the Interface with a Ferroelectric Layer-Reference-Cited by-同舟云学术

Two-Photon Selective Reflection Spectroscopy of Confined Atomic Vapor at the Interface with a Ferroelectric Layer

Published:2013-03 Issue: Volume:669 Page:226-232
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Li Yuan Yuan¹,Li Li¹,Lu Yi Xin¹,Zhang Xiang Wu¹

Affiliation:

1. Xi’an University of Arts and Science

Abstract

We examine two-photon selective reflection (SR) spectroscopy in a system of -type three-level atoms at the interface with a ferroelectric layer on a dielectric surface. Two-photon SR lines, exhibiting Dicke-narrowing profiles due to atom-wall collision and Doppler free configuration, are periodically modulated by the thickness of the atomic vapor. These SR lines can be modified by the thickness and the complex refractive index of the ferroelectric layer, and can probably be a feasible method used in the measurement of the optical parameters of the ferroelectric layer.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.669.226.pdf

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