Determination of Coated Substrate Roughness by Quantification of Measured Depth Profiles

Abstract

The glow discharge optical emission spectroscopy (GDOES) depth profiles of zinc-coated copper substrates polished by different mesh size sandpapers are well fitted with the mixing-roughness-information (MRI) model. Based on the MRI fits, the copper substrate roughness parameters and the coating layer thickness values are extracted. Using the so-called 84% to 16% method, the depth resolution values of the measured GDOES depth profiles are obtained, thereby the respective roughness parameters are determined. The obtained zinc-coated copper substrate roughness values are correlated with the experimental measurements.