Development of Integrated Testing Instrument for Mechatronic System

Author:

Liu Bai Lin1,Li Lei1

Affiliation:

1. Xi’an Technological University

Abstract

In order to improve the effectiveness of fault diagnosis for mechatronic system, new integrated testing instrument was developed. The testing instrument was integrated with experience, detected data and complex technical principles. The structure of the integrated testing instrument was introduced. The system is divided into fault diagnosis expert system and signal processing device. Fault diagnosis expert system software is to complete the human-computer interaction, testing process control, test result analysis processing, output display and fault diagnosis. Signal processing instrument includes test signal acquisition, signal conditioning, data acquisition, and data communication. Experiments show that the instrument can find the fault efficiently and improve the maintenance efficiency of a certain type of mechatronic system.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference10 articles.

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