Optimization and Characterization of Aluminum Induced Texture Using Radio Frequency Power

Abstract

The purpose of this study aims to investigate the surface morphology and roughness of Aluminum induced glass texturing (AIT) substrate after different surface treatments. Aluminum layers were deposited in thickness 370 nm and 240 nm on corning glass sheet using Radio Frequency (RF) power. The effect of different concentrations of hydrofluoric acid (HF), 4%, 5% and 6% on morphology, optical absorption and surface roughness of glass was described. The dipping time of coated glass sheet in HF for 2 min and 5 min created very rough and soft surface, respectively. Optical absorption of AIT substrate after dipping in HF was measured. The optimum texturing process achieved by deposition of aluminum layer 240 nm of thickness and dipping the substrate in 5% HF. The AIT substrate was characterized by low angle X-ray diffraction (XRD), ultraviolet-visible spectrophotometer (UV-VIS), stylus profiler and scanning electron microscope (SEM).