Research on Spurious Trip of 1oo2 Safety Instruments of Petrochemical Installation with Repair Considered

Author:

Zhu Jian Xin1,Chen Xue Dong1,Bao Shi Yi2

Affiliation:

1. Hefei General Machinery Research Institute

2. Zhejiang University of Technology

Abstract

An innovative nuisance trip calculation method based on Markov model was proposed in this paper which was used to evaluate the effect of repairment on system reliability. By analysis of the availabilities of classic 1 out of 2 (1oo2) repairable system, a new definition of spurious trip was put forwarded where online repair was considered. Compared with the benefits obtained by online repairment, the repair-caused-nuisance-trip was analyzed in this paper. Numerical calculation revealed that the online repair is helpful for anti-spurious trip in 1oo2 redundant system. Dangerous failures, if not repaired or cannot be online fixed, have complex influence on system reliability. The dangerous failure is sometimes benefit for anti-spurious performance if it is not repaired. But Mean Time To Failure Spurious (MTTFs) reduces with the increase of dangerous failure provided that dangerous failure rate is bigger than safe failure rate. Meanwhile, the finding that common cause can reduce the chance of nuisance trip was also proposed in this paper, though the influence is too small to be neglected.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference8 articles.

1. IEC commission, Functional safety -Safety instrumented systems for the process industry sector -Part 1: Framework, definitions, system, hardware and software requirements. 2003. 1.

2. ISA-TR84. 00. 02-2002-Part 2, Instrument society of America, 19996, p.24.

3. Smith, David J. Reliability, Maintainability and Risk: Practical Methods for Engineers. 5th Edition. Butterworth-Heinemann, (1997).

4. William M. Goble, Control System Reliability & Evaluation, ISA-The Instrumentation, Systems, and Automation Society, (1998).

5. Julia V. Bukowski, William M. Goble, Defining Mean Time-to-Filure in a Particular Filure-State for Multi-Failure-State Systems[J], IEEE Transactions on Reliability, 2000(50): 221-228.

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