Failure Analysis and Precaution of NPN Transistors G3G33A

Author:

Huang Jiao Ying1,Hu Zhen Yi1,Zhao Peng1,Gao Cheng1

Affiliation:

1. Beihang University

Abstract

Failure analysis (FA) is a critical element in the development of engineering processes and products. FA of components is the process of identifying failure mode/mechanism and finding out the causes of failure that relies on using of different testing techniques and analysis methods. It provides information necessary for technology advancement and for corrective action to improve quality and reliability. IC’s for military and space applications have extremely stringent reliability requirements. In this paper, the role of FA was discussed. And common and new techniques and tools were reviewed. Then the failure analysis of NPN transistors G3GGA was completed. Conclusions and recommendations for the analysis of failure sample and additional sample within the same batch are drawn from the discussions. This paper might serve as a reference to laboratories when encountering such problems.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3